The 2019 conference of the Korea Institute of Materials Science (KIMS) was held in Daegu, South Korea, from October 23 to 25. The event focused on the development of new technologies for the analysis and measurement of metallic materials and aimed to build bridges for collaboration among enterprises, research institutes, and universities. XTOP3D was invited to participate and showcased its flagship product—the XTDIC 3D full-field strain measurement and analysis system—which is capable of competing with offerings from major international players, thereby adding a highlight to the event.
The event was organized by the Korea Institute of Metals and Materials (KIMM). Since its establishment in 1946, the institute has dedicated itself to fostering exchanges with counterpart organizations in other countries—including the joint hosting of international conferences and symposia—to enhance scientific and technological cooperation and promote friendly relations. These events aim to advance South Korea's science and technology sectors on both domestic and international fronts, while keeping researchers informed of the latest research trends and case studies from leading nations in the field.
In the realm of experimental solid mechanics, measuring surface deformation in materials and structures under various loading conditions has long been a key area of research. At the exhibition, XTOP3D showcased its XTDIC 3D full-field strain measurement and analysis system; Mr. Jay Park, the company's South Korean representative, provided on-site demonstrations and explanations regarding the system's applications in materials testing.
Traditional contact-based measurement methods are limited by their techniques, preventing the acquisition of full-field data and restricting the measurement range, which makes it impossible to capture the overall deformation behavior of materials. XTDIC, which utilizes digital image correlation technology, processes digital images; consequently, it has less stringent requirements for light sources and the measurement environment. Combined with the high precision inherent in digital image processing, it serves as a powerful and flexible tool for measuring surface deformation in materials.
The XTDIC 3D full-field strain measurement and analysis system boasts extensive practical experience in the mechanical testing and analysis of materials. It is particularly effective for measuring the deformation of rock, wood, biological materials, and low-dimensional membrane materials, and is highly mature in its application to the tensile deformation of metal sheets. The system enables full-field strain analysis and calculation for specimen surfaces of various shapes—such as smooth or notched specimens—allowing for the rapid acquisition of surface deformation and strain data.
At the exhibition, numerous visitors came to the booth to view the products. Mr. Jay Park conducted live demonstrations and provided detailed explanations of the XTDIC system. Visitors showed keen interest, engaging in in-depth discussions and highly commending the technical highlights and practical applications of the XTDIC product.
